Hitachi's Patent Suit Puts FEI Under The Microscope

Law360, New York (November 13, 2009, 4:52 PM EST) -- Electron microscope supplier FEI Co. has disclosed a lawsuit in which a unit of Hitachi Ltd. accused it of infringing several patents that pertain to micro-sampling technology.

The suit was brought by Hitachi High-Technologies Corp. in the Tokyo District Court, according to a Form 8-K that FEI filed Thursday with the U.S. Securities and Exchange Commission.

“We have not yet had the opportunity to review the complaint,” FEI said in its filing. “We intend to vigorously defend our interests in this matter and, based on information...
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