ITC To Investigate Micronics, Phicom Probe Cards

Law360, New York (December 14, 2007, 12:00 AM EST) -- The U.S. International Trade Commission announced on Thursday that it has voted to launch a patent infringement investigation of probe card assemblies and DRAM and NAND flash chips made by Micronics Japan Co. Ltd. and Phicom Corp.

Probe card assemblies are devices used to test microchips, while the DRAM and NAND chips under investigation were allegedly tested with those devices.

The commission launched the investigation in response to a complaint by California probe card maker FormFactor Inc., which named Micronics Japan, South Korea-based Phicom, and their...
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