FormFactor's Patent Suit Stayed During ITC Probe

Law360, New York (February 13, 2008, 12:00 AM EST) -- A federal judge has stayed a patent dispute between FormFactor Inc. and Micronics Japan Co. over wafer probe cards pending the outcome of a U.S. International Trade Commission antitrust investigation involving the cards.

FormFactor, which petitioned the ITC to launch the investigation last year, had opposed the stay, saying that it would be prejudiced by the delay of its patent suit. The judge presiding over the suit disagreed.

Judge Jeffrey S. White, of the U.S. District Court for the Northern District of California, said Monday that...
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