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August 22, 2014

In-Depth Test LLC v. Fairchild Semiconductor Corporation

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Case Number:

1:14-cv-01090

Court:

Delaware

Nature of Suit:

Patent

Judge:

Gregory M. Sleet

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Companies

Sectors & Industries:

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Reflects complaints, answers, motions, orders and trial notes entered from Jan. 1, 2011.
Additional or older documents may be available in Pacer.

Coverage

  1. August 25, 2014

    Semiconductor Cos. Hit With Auto Power Patent Suits

    Fairchild Semiconductor Corp. and Linear Technology Corp. were hit Friday with a pair of patent infringement suits in Delaware federal court, accusing the companies of ripping off In-Depth Test LLC's semiconductors testing systems used in automotive power applications and smart car technology.

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